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About:
conductive layer
Premodifier: conductiveHead noun: layer
Same concepts
Broader concepts
label
provenance
confidence
layer
isap:
370507145
0.881462
more additional layer
isap:
370507621
0.827162
functional layer
isap:
370507873
0.782902
first conductive layer
isap:
370507857
0.745402
more conductive layer
isap:
370509218
0.721100
conductive layer
isap:
370507230
0.680919
layer of material
isap:
370508090
0.676559
example
isap:
230836695
0.658006
counter electrode
isap:
340264414
0.613959
component
isap:
336158744
0.574625
material
isap:
293789281
0.570001
portion
isap:
227810514
0.569557
electrode
isap:
340264396
0.551972
substrate
isap:
336237960
0.545298
opening
isap:
226156133
0.499711
semiconductor
isap:
96668021
0.466315
laminate
isap:
291739984
0.452009
coating
isap:
228959063
0.403754
art
isap:
325785521
0.393419
contact
isap:
228576067
0.385720
power
isap:
369930509
0.385086
film
isap:
199833509
0.384920
structure
isap:
337258133
0.373094
device
isap:
159958083
0.368857
metal
isap:
373956483
0.366624
oxide
isap:
368858188
0.330971
region
isap:
161039593
0.329666
method
isap:
158044471
0.318906
word line
isap:
200098754
0.311995
copper
isap:
165312913
0.222456
element
isap:
221495794
0.141137
Narrower concepts
label
provenance
confidence
gate electrode
isap:
13808978
0.914489
copper layer
isap:
370507342
0.828113
second conductive layer
isap:
370509105
0.808421
layer
isap:
370507157
0.803186
first conductive layer
isap:
370507841
0.801741
dielectric layer
isap:
370507561
0.791238
polysilicon layer
isap:
370507216
0.779872
ground layer
isap:
370507823
0.772652
intermediate layer
isap:
370508262
0.763669
gold layer
isap:
370507559
0.760216
doped polycrystalline silicon
isap:
33838095
0.757734
metal layer
isap:
370507200
0.728661
al layer
isap:
370509640
0.718353
doped semiconductor substrate
isap:
14004440
0.714722
refractory metal
isap:
374720497
0.709974
titanium nitride
isap:
36263104
0.707122
doped polysilicon
isap:
414083963
0.688723
metal film
isap:
85799749
0.681071
conductive layer
isap:
370507230
0.680919
bonding pad
isap:
467629985
0.669545
seed layer
isap:
370507683
0.660066
electrode
isap:
13808975
0.634224
metal line
isap:
88693982
0.633814
first electrode
isap:
13809013
0.621055
conductive member
isap:
118218044
0.608766
aluminum foil
isap:
90982419
0.605215
metal such as tungsten
isap:
374720480
0.598439
plate metal layer
isap:
370509260
0.596620
polysilicon
isap:
414083957
0.549866
ti
isap:
464082079
0.542122
conductive material
isap:
360099272
0.530170
indium-tin oxide ito
isap:
471220776
0.524990
spacer layer
isap:
370507723
0.523234
al
isap:
464758981
0.520896
power plane
isap:
374782576
0.511031
w
isap:
131432361
0.500026
layer 18
isap:
370508392
0.497990
side wall
isap:
88278003
0.497224
metal
isap:
374720455
0.495326
ito
isap:
471220772
0.486027
conductive particle
isap:
358127430
0.485216
tin
isap:
469529101
0.464129
lead
isap:
95441050
0.457660
tungsten
isap:
360741565
0.437930
metallization
isap:
142086859
0.428029
silicon
isap:
33838097
0.422184
copper
isap:
119954894
0.418327
titanium
isap:
359754804
0.405732
cu
isap:
465405039
0.403860
aluminum
isap:
358513287
0.397450
ground
isap:
114702711
0.386448
portion
isap:
40110257
0.368100
graphite
isap:
358990851
0.366268
embodiment
isap:
474052874
0.352170
tantalum
isap:
358994220
0.346784
sputtering
isap:
475506755
0.342999
like
isap:
91212927
0.331264
source
isap:
115259993
0.326159
gate
isap:
93984671
0.313699
gold
isap:
93730563
0.310641
substrate
isap:
14004402
0.296346
sidewall
isap:
360856269
0.289511
material
isap:
360099279
0.254850
region
isap:
123813692
0.240820
pattern
isap:
37452986
0.224454
example
isap:
39989057
0.212165
film
isap:
85799707
0.210115
surface
isap:
35985446
0.199725
means
isap:
368772812
0.198711
line
isap:
88693975
0.196943
method
isap:
123423972
0.195647
case
isap:
87266382
0.176283
vacuum
isap:
116184489
0.169552
carbon
isap:
121398342
0.159569
thickness
isap:
15823542
0.125116
process
isap:
36094855
0.043366